Adjacent Bit XOR Operation Based Test Data Compression Method

Authors

Yifei Cheng, 1. School of Computer and Information, Anqing Normal College, Anqing 246001, China; ;
Wenfa Zhan, 2. Department of Science Research, Anqing Normal College, Anqing 246001, China;

Abstract

Abstract: Data compression is a very effective method to reduce the test cost. An adjacent bit XOR operation based test data compression method was proposed based on bitwise XOR operation between itself and its previous bit, which turned continuous series, such as a series of all 0s and all 1s into series of all 0s, and reversal series, such as a series of 01 and 10 into series of all 1s by bitwise XOR operation between adjacent bits. On one hand, the two kinds of series, continuous series and reversal series, were both taken into account, which decreased the number of division. On the other hand, it increases the minimum encoding run length, so the minimum encoding run length increases from a conventional 0 to 2. The compression ratio is further improved without additional hardware decoding circuitry overhead. The experimental results illustrate the method has a high data compression ratio.

Recommended Citation

Cheng, Yifei and Zhan, Wenfa (2020) "Adjacent Bit XOR Operation Based Test Data Compression Method," Journal of System Simulation: Vol. 27: Iss. 11, Article 19.
Available at: https://dc-china-simulation.researchcommons.org/journal/vol27/iss11/19

First Page

2756

Revised Date

2014-06-20

DOI Link

https://doi.org/

Last Page

2761

CLC

TP391.76

Recommended Citation

Cheng Yifei, Zhan Wenfa. Adjacent Bit XOR Operation Based Test Data Compression Method[J]. Journal of System Simulation, 2015, 27(11): 2756-2761.