Research on Sparse Grid Non-uniformity Correction Technologies for Infrared Imaging Resistor Array

Authors

Huijie Du, Science and Technology on Space System Simulation Laboratory, Beijing Simulation Center, Beijing 100854, China;
Hongming Zhao, Science and Technology on Space System Simulation Laboratory, Beijing Simulation Center, Beijing 100854, China;
Yu Hong, Science and Technology on Space System Simulation Laboratory, Beijing Simulation Center, Beijing 100854, China;
Gao Yang, Science and Technology on Space System Simulation Laboratory, Beijing Simulation Center, Beijing 100854, China;
Zhang Yi, Science and Technology on Space System Simulation Laboratory, Beijing Simulation Center, Beijing 100854, China;

Abstract

Abstract: The non-uniformity characteristic is the crucial factors affecting the image quality projected by infrared imaging resistor array, and which affects the fidelity of the infrared scene simulation. The non-uniformity characters of the infrared imaging simulation resistor array were analyzed based on measured data; the sparse grid and the flood non-uniformity correction technologies were investigated and analyzed and based on the existing measuring technology the improved sparse grid method for engineering was proposed. Through measuring the non-uniformity data, establishing the linear look-up table and correcting the non-uniformity image, the non-uniformity correction algorithm was developed and validated. The result shows that the image quality has a remarkable improvement after non-uniformity correction, the non-uniformity correction flow and algorithm preferably satisfy the requirement of the high confidence infrared imaging simulation.

Recommended Citation

Du, Huijie; Zhao, Hongming; Hong, Yu; Yang, Gao; and Yi, Zhang (2020) "Research on Sparse Grid Non-uniformity Correction Technologies for Infrared Imaging Resistor Array," Journal of System Simulation: Vol. 28: Iss. 1, Article 10.
Available at: https://dc-china-simulation.researchcommons.org/journal/vol28/iss1/10

First Page

70

Revised Date

2015-01-14

DOI Link

https://doi.org/

Last Page

76

CLC

V448.25

Recommended Citation

Du Huijie, Zhao Hongming, Yu Hong, Gao Yang, Zhang Yi. Research on Sparse Grid Non-uniformity Correction Technologies for Infrared Imaging Resistor Array[J]. Journal of System Simulation, 2016, 28(1): 70-76.