Research on Switched Current Mirror Mismatch and Simulation

Authors

Jierong Guo, 1. School of Electrical Engineering and Automation Postdoctoral Mobile Research Station, Hefei University of Technology, Hefei 230009, China;;2. Key Lab of Integrated with Optoelectronic Information and Optical Fabrication in Hunan, Changde 415000, China;
Yigang He, 1. School of Electrical Engineering and Automation Postdoctoral Mobile Research Station, Hefei University of Technology, Hefei 230009, China;;
Changqing Liu, 1. School of Electrical Engineering and Automation Postdoctoral Mobile Research Station, Hefei University of Technology, Hefei 230009, China;;2. Key Lab of Integrated with Optoelectronic Information and Optical Fabrication in Hunan, Changde 415000, China;

Abstract

Abstract: Typical sources of switched current mirror mismatch were discussed. The most important three parameter of mismatch: transconductance, threshold voltage and the sub threshold slope were analyzed, due to the switch current circuit adopts the width to length ratio characteristic for calibration design. SPICE model using Hspice platform and 0.18 um BSIM3_V3.1 were proposed for circuit simulation. The simulation and analysis of mismatch were executed based on two kinds of operating rules of weak inversion and strong inversion. The compensation ability for mismatch was provided by floating gate switch current mirror which was also verified by simulation. Analysis and simulation results of two kinds of operation rules were also given.

Recommended Citation

Guo, Jierong; He, Yigang; and Liu, Changqing (2020) "Research on Switched Current Mirror Mismatch and Simulation," Journal of System Simulation: Vol. 28: Iss. 2, Article 18.
Available at: https://dc-china-simulation.researchcommons.org/journal/vol28/iss2/18

First Page

383

Revised Date

2014-12-25

DOI Link

https://doi.org/

Last Page

387

CLC

TN317

Recommended Citation

Guo Jierong, He Yigang, Liu Changqing. Research on Switched Current Mirror Mismatch and Simulation[J]. Journal of System Simulation, 2016, 28(2): 383-387.