Travel Time Reliability of Inside Area of Roundabouts

Authors

Yuzhou Duan, 1. School of Civil Engineering and Architecture, Henan University of Technology, Zhengzhou 450001, China;;
Tingting Chai, 2. Beijing E-Hualu Information Technology Co. LTD, Changchun 130022, China;
Jian Jie, 1. School of Civil Engineering and Architecture, Henan University of Technology, Zhengzhou 450001, China;;

Abstract

Abstract: Based on the travel time reliability, this paper analyzes the traffic states in the inside area of the roundabout. The travel time reliability model is established from three aspects: route path, entrance and system, and the practicability of the model is verified by the VISSIM simulation. On this basis, the correlation analysis is made on between the adjacent paths of the same entrance and adjacent paths of the adjacent entrances, and the fitting equations are obtained. Taking the number of lanes, traffic volumes, proportion of left-turns and the rate of heavy vehicles as variables, a sensitivity analysis of different types of travel time reliability is conducted, which verifies the applicability of the proposed model. The results enrich the evaluation index system of roundabout.

Recommended Citation

Duan, Yuzhou; Chai, Tingting; and Jie, Jian (2019) "Travel Time Reliability of Inside Area of Roundabouts," Journal of System Simulation: Vol. 31: Iss. 3, Article 9.
DOI: 10.16182/j.issn1004731x.joss.17WJP-020
Available at: https://dc-china-simulation.researchcommons.org/journal/vol31/iss3/9

First Page

438

DOI Link

https://doi.org/10.16182/j.issn1004731x.joss.17WJP-020

Last Page

447

CLC

U491.2

Recommended Citation

Duan Yuzhou, Chai Tingting, Jian Jie. Travel Time Reliability of Inside Area of Roundabouts[J]. Journal of System Simulation, 2019, 31(3): 438-447.

DOI

10.16182/j.issn1004731x.joss.17WJP-020