Reliability Simulation Testing and Verification Technologies for Intelligent Systems: Frontiers, Progress, and Challenges

Authors

Zili Wang, National Key Laboratory of Reliability and Environmental Engineering, Beijing 100191, China; School of Reliability and Systems Engineering, Beihang University, Beijing 100191, China
Yuntian Gao, National Key Laboratory of Reliability and Environmental Engineering, Beijing 100191, China; School of Reliability and Systems Engineering, Beihang University, Beijing 100191, China
Dezhen Yang, National Key Laboratory of Reliability and Environmental Engineering, Beijing 100191, China; School of Reliability and Systems Engineering, Beihang University, Beijing 100191, China
Yeyang Liu, National Key Laboratory of Reliability and Environmental Engineering, Beijing 100191, China; School of Reliability and Systems Engineering, Beihang University, Beijing 100191, China
Yi Ren, National Key Laboratory of Reliability and Environmental Engineering, Beijing 100191, China; School of Reliability and Systems Engineering, Beihang University, Beijing 100191, China

Abstract

Abstract: Intelligent systems are extensively deployed in domains such as transportation, energy and water resources, smart healthcare, and aerospace, where their reliability is directly linked to public safety and social stability, thus requiring thorough and scientifically rigorous verification. This article conducted an in-depth exploration of the current state of reliability simulation and verification techniques for intelligent systems. It defined the concept of reliability specific to intelligent systems and identified key challenges they face in areas including mission scenario modeling, characteristic modeling and simulation, evaluation and verification, and simulation platforms. Future development requirements were proposed to guide research toward more trustworthy, precise, and efficient reliability simulation and verification technologies for intelligent systems, thereby facilitating their high-quality development.

Recommended Citation

Wang, Zili; Gao, Yuntian; Yang, Dezhen; Liu, Yeyang; and Ren, Yi (2025) "Reliability Simulation Testing and Verification Technologies for Intelligent Systems: Frontiers, Progress, and Challenges," Journal of System Simulation: Vol. 37: Iss. 7, Article 1.
DOI: 10.16182/j.issn1004731x.joss.25-0554
Available at: https://dc-china-simulation.researchcommons.org/journal/vol37/iss7/1

First Page

1583

Last Page

1606

CLC

TP18; TP391.9; TB114.3

Recommended Citation

Wang Zili, Gao Yuntian, Yang Dezhen, et al. Reliability Simulation Testing and Verification Technologies for Intelligent Systems: Frontiers, Progress, and Challenges[J]. Journal of System Simulation, 2025, 37(7): 1583-1606.

Corresponding Author

Yang Dezhen

DOI

10.16182/j.issn1004731x.joss.25-0554