Journal of System Simulation
Abstract
Abstract: Through XFDTD software simulating strong lightning electromagnetic pulse of 50KV lightning electric field strength, rising edge about 50ns, and pulse width about 2000ns coupled with a desktop computer, the curves of the coupled electric field with time and the curves of the energy density with time at several typical locations in the chassis are obtained; the shielding effectiveness of different locations inside the computer is analyzed. Simulation results suggest that the electromagnetic field strength produced in the chassis has no damage to the computer node while coupling energy generated in the hole is large in comparison with the threshold electromagnetic pulse power density, which provides a reference for EMC design of portable computer.
Recommended Citation
Du, Gaihong; Tian, Yangmeng; Wang, Caixia; and Wang, Hongwei
(2020)
"Simulation of Influence of Lightning on Internal Electromagnetic Environment of Computer,"
Journal of System Simulation: Vol. 29:
Iss.
12, Article 23.
DOI: 10.16182/j.issn1004731x.joss.201712023
Available at:
https://dc-china-simulation.researchcommons.org/journal/vol29/iss12/23
First Page
3107
DOI Link
https://doi.org/10.16182/j.issn1004731x.joss.201712023
Last Page
3113
CLC
TM937
Recommended Citation
Du Gaihong, Tian Yangmeng, Wang Caixia, Wang Hongwei. Simulation of Influence of Lightning on Internal Electromagnetic Environment of Computer[J]. Journal of System Simulation, 2017, 29(12): 3107-3113.
DOI
10.16182/j.issn1004731x.joss.201712023
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